Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6874550 | Journal of Computational Science | 2016 | 5 Pages |
Abstract
A multiscale computational framework for coupling the multiple length scales in chemical vapor deposition (CVD) processes is implemented for studying the effect of the prevailing conditions inside a CVD reactor (macro-scale) on the film growth on a wafer with predefined topography (micro-scale). A multi-parallel method is proposed for accelerating the computations. It combines domain decomposition methods for the macro-scale (reactor scale) model, which is based on partial differential equations (PDEs), and a synchronous master-worker scheme for the parallel computation of the boundary conditions (BCs) for the PDEs; BCs are coming from the micro-scale model describing film growth on the predefined topography.
Related Topics
Physical Sciences and Engineering
Computer Science
Computational Theory and Mathematics
Authors
N. Cheimarios, G. Kokkoris, A.G. Boudouvis,