ZATPG: SAT-based test patterns generator with zero-aliasing in temporal compaction

We demonstrate our method on MISR compactors based on LFSR and cellular automata, using the single stuck-at fault model. Our method is able to find a test with zero aliasing and complete fault coverage for smaller compactors than a conventional, unguided ATPG. Thus, the area overhead of the compactor can be reduced, while the complete fault coverage is preserved.