Article ID Journal Published Year Pages File Type
6894352 Engineering Science and Technology, an International Journal 2016 8 Pages PDF
Abstract
In the complex computing system, processing units are dealing with devices of smaller size, which are sensitive to the transient faults. A transient fault occurs in a circuit caused by the electromagnetic noises, cosmic rays, crosstalk and power supply noise. It is very difficult to detect these faults during offline testing. Hence an area efficient fault tolerant full adder for testing and repairing of transient and permanent faults occurred in single and multi-net is proposed. Additionally, the proposed architecture can also detect and repair permanent faults. This design incurs much lower hardware overheads relative to the traditional hardware architecture. In addition to this, proposed design also provides higher error detection and correction efficiency when compared to the existing designs.
Related Topics
Physical Sciences and Engineering Computer Science Computer Science (General)
Authors
, ,