Article ID Journal Published Year Pages File Type
6952430 Egyptian Journal of Basic and Applied Sciences 2016 11 Pages PDF
Abstract
The automatic variable wavelength interferometry, VAWI, technique is used to determine the optical properties of Poly(ether ether ketone), PEEK, highly oriented fiber. The main part of this technique is the Pluta polarizing interference microscope attached with the automatic moving interference filter via stepper motor. The VAWI technique depends on measuring the optical path length differences at certain positions in microinterferogram. These positions are the coincidence and anti-coincidence of the fiber fringe with the free medium fringes. The measured refractive indices and birefringence values are utilized to calculate some optical constants of PEEK fiber using Cauchy and Sellmeier's equations. Also using some structure relationship, some molecular structure and orientation parameters of PEEK fiber as a function of the wavelength of the incident light are calculated. The method allows us to determine any molecular structure parameters of PEEK fiber at any wavelength in the visible spectrum. Microinterfrograms are given for illustration.
Related Topics
Physical Sciences and Engineering Computer Science Signal Processing
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