| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6979922 | Colloids and Surfaces A: Physicochemical and Engineering Aspects | 2012 | 7 Pages |
Abstract
⺠Principles of evanescent wave optics are reviewed. ⺠Simulated measurements of thin film thickness are illustrated. ⺠Example application to acquired images of real emulsion films demonstrates the reliability of the presented methodology for observing the thinning behavior of the film with a sub-wavelength spatial resolution.
Keywords
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Colloid and Surface Chemistry
Authors
R. Gabrieli, G. Loglio, P. Pandolfini, A. Fabbri, M. Simoncini, V.I. Kovalchuk, B.A. Noskov, A.V. Makievski, J. Krägel, R. Miller, F. Ravera, L. Liggieri,