Interaction forces between silica surfaces in cationic surfactant solutions: An atomic force microscopy study

► A correlation between surface forces and surfactant morphologies has been established. ► A different point of zero charge was obtained at the silica particle and the silicon wafer surface. ► The aggregates on the colloidal silica particles and on the silicon wafer are different. ► Attractive forces dominate the interaction at low surfactant concentration. ► Patchwise hexadecyltrimethylammonium bromide adsorption occurs at the oxidized silicon wafer.