Generation of candidates' tree for the fault diagnosis of discrete event systems

This paper presents a discrete event model-based approach for Fault Detection and Isolation of manufacturing systems. This approach considers a system as a set of independent Plant Elements (PEs). Each PE is composed of a set of interrelated Parts of Plant (PoPs) modeled by a Moore automaton. Each PoP model is only aware of its local behavior. The degraded and faulty behaviors are added to each PoP model in order to obtain extended PoP ones. An extrapolation of Gaussian learning is realized to obtain acceptable temporal intervals between the time occurrences of correlated events. Finally based on the PoP extended models and the links between them, a fault candidates' tree is established for each plant element. This candidates' tree corresponds to a local on-line fault event occurrence observer, called diagnoser. Thus, the diagnosis decision is distributed on each plant element. An application example is used to illustrate the approach.

► Division of plant into Plant Elements composed of Parts of Plant (preactuator, actuator or sensor). ► Analysis of degraded and faulty behaviors of each Part of Plant to return labels of behavior. ► Simulation of scenarios to obtain acceptable temporal intervals between events. ► Construction of a candidates' tree from each PE, called diagnoser.