Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7000298 | Journal of Colloid and Interface Science | 2013 | 8 Pages |
Abstract
⺠Electron tomography (ET) provides 3D analysis with nanometre resolution. ⺠Compressed sensing (CS) reduces the number of images needed for ET reconstruction. ⺠The essence and value of CS-ET are outlined and demonstrated with examples. ⺠CS-ET has the potential to enable study of beam sensitive materials. ⺠An appendix discusses the salient aspects of CS in tutorial fashion.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Colloid and Surface Chemistry
Authors
John Meurig Thomas, Rowan Leary, Paul A. Midgley, Daniel J. Holland,