Article ID Journal Published Year Pages File Type
7000298 Journal of Colloid and Interface Science 2013 8 Pages PDF
Abstract
► Electron tomography (ET) provides 3D analysis with nanometre resolution. ► Compressed sensing (CS) reduces the number of images needed for ET reconstruction. ► The essence and value of CS-ET are outlined and demonstrated with examples. ► CS-ET has the potential to enable study of beam sensitive materials. ► An appendix discusses the salient aspects of CS in tutorial fashion.
Keywords
Related Topics
Physical Sciences and Engineering Chemical Engineering Colloid and Surface Chemistry
Preview
A new approach to the investigation of nanoparticles: Electron tomography with compressed sensing
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