Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
701149 | Diamond and Related Materials | 2008 | 5 Pages |
Abstract
Ni incorporated Fullerene (C60) nanowhiskers have been prepared by liquid–liquid interfacial precipitation method. The prepared nanowhiskers were characterized using various analytical tools such as optical microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), and micro-Raman spectroscopy. The microscopic images reveal that the formation of tubular and non tubular nanowhiskers with fine dispersion of Ni atoms in the nanowhiskers. The TEM mapping analysis confirms the presence of Ni atoms in the nanowhiskers. XRD analysis and the electron diffraction pattern substantiate the presence of fcc crystalline structure and Raman spectroscopy reveals the polymerization of nanowhiskers.
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Electrical and Electronic Engineering
Authors
M. Sathish, K. Miyazawa, T. Sasaki,