Boron-doped hydrogenated amorphous carbon films grown by surface-wave mode microwave plasma chemical vapor deposition

We report the effects of boron (B) doping on optical and structural properties of the hydrogenated amorphous carbon thin films grown by surface-wave mode microwave plasma (SW-MWP) chemical vapor deposition (CVD) on n-type silicon and quartz substrates at room temperature. Argon and acetylene were used as a carrier and carbon source gases respectively. Analytical methods such as X-ray photoelectron spectroscopy (XPS), Nanopics 2100/NPX200 surface profiler, JASCO V-570 UV/VIS/NIR spectroscopy, Fourier transform infrared spectroscopy (FT-IR) and Raman spectroscopy were employed to investigate the properties of the films. Low atomic concentration of B (0.08 at.%) was found in the doped film. The optical band gap of the undoped film was 2.6 eV and it decreased to 1.9 eV for the B-doped film. Structural property shows the crystalline structure of the film and it has changed after incorporating B as a dopant. The structural modifications of the films leading to being more graphite in nature were confirmed by the Raman and FT-IR characterization.