Enhancement of fluorine doped amorphous carbon thin films from microwave surface wave plasma activated above room temperature

Fluorinated amorphous carbon (a-C:F) thin films were synthesized above room temperature by microwave surface wave plasma chemical vapour deposition (MW SWP CVD). The effect of deposition temperature on optical, electrical, chemical and bonding properties of the a-C:F films were studied by ultraviolet–visible spectroscopy (UV–VIS), Fourier transform infrared spectroscopy (FTIR), X-ray photoelectron spectrometry (XPS), Raman spectrometry and TEM measurements. The film exhibits high transparency and decrease in optical band gap with increasing deposition temperature. FTIR study shows the increase in CC and decrease in C–Fx bonds of the films with increasing deposition temperature. Raman study shows some important structural changes in the films due to fluorine incorporation. XPS result shows the shift of carbon peak to higher binding energy due to carbon fluorine link to the films. TEM shows the increasing graphitic layer in the films with increasing deposition temperature.