Article ID Journal Published Year Pages File Type
7118628 Materials Science in Semiconductor Processing 2015 14 Pages PDF
Abstract
Atomic-scale structure and composition is critical to understand the novel properties and to realize the technological applications of semiconductor nanowires. This paper reviews the latest progresses in atomic-scale tomography of various semiconductor nanowires for application in electronics, photonics, thermoelectrics and photovoltaics. In practice, specimen preparation is usually the obstacle for the atomic-scale tomographic experiment. In this regard, promising specimen preparation methods from semiconductor nanowires are also summarized and compared. The unprecedented information extracted from 3D reconstruction of tomographic data provides deep insight into semiconductor nanowires and enables understanding of properties and optimization of growth.
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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