Article ID Journal Published Year Pages File Type
7151168 Solid-State Electronics 2012 8 Pages PDF
Abstract
► The two-stage trigger (TST) scheme is better than the single-stage trigger scheme. ► The TST scheme does not induce the leakage issue under the IC normal operation. ► The TST scheme can reduce the ESD device trigger-on voltage (Vt1). ► TST Vt1 is below the protected device Vt1 and the oxide breakdown voltage (Tox ⩽ 20 Å). ► The applications are for the core devices in RF nanometer technologies.
Keywords
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
Authors
, , , , ,