Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7151168 | Solid-State Electronics | 2012 | 8 Pages |
Abstract
⺠The two-stage trigger (TST) scheme is better than the single-stage trigger scheme. ⺠The TST scheme does not induce the leakage issue under the IC normal operation. ⺠The TST scheme can reduce the ESD device trigger-on voltage (Vt1). ⺠TST Vt1 is below the protected device Vt1 and the oxide breakdown voltage (Tox ⩽ 20 Ã
). ⺠The applications are for the core devices in RF nanometer technologies.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Jian-Hsing Lee, Yi-Hsun Wu, Shao-Chang Huang, Yu-Huei Lee, Ke-Horng Chen,