| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 730924 | Measurement | 2010 | 13 Pages |
Abstract
An analytical description of the phase-plane behavior of a dual-tone signal for nonlinear analog-to-digital converters testing is presented. A quality index for the phase-plane coverage of the dual-tone test signal is proposed and evaluated. Conditions for optimal input frequency selection are analytically derived for practical calibration applications, and numerical results highlighting the working of the proposed approach are provided.
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Physical Sciences and Engineering
Engineering
Control and Systems Engineering
Authors
Conceição LÃbano Monteiro, Pasquale Arpaia, António Cruz Serra,