Analysis of white-light interferograms by using Stockwell transform

This paper proposes the use of Stockwell transform for the analysis of white-light interferograms. The performance of Stockwell transform is assessed from the statistical parameters obtained by analyzing the simulated and experimental interferograms. Furthermore, the sensitivity of Stockwell transform to sampling, intensity and the phase noises is investigated. Results show that sampling and intensity noises significantly affect the performance of Stockwell transform.