| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 747243 | Solid-State Electronics | 2010 | 5 Pages |
Abstract
The backward propagation of variance (BPV) technique for statistical modeling has proven to be efficient and effective in practice. In this paper we extend the BPV formalism to explicitly include modeling of the correlations between electrical performances. The new formulation is verified by applying it to two different MOSFET models and two different manufacturing technologies.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Ivica StevanoviÄ, Xin Li, Colin C. McAndrew, Keith R. Green, Gennady Gildenblat,