Detailed X-ray diffraction analysis of Ce1-xNdxO2-(x/2) as a surrogate for substoichiometric americium oxide

In this study, a Rietveld refinement investigation is presented, which has enabled the lattice parameter of the material to be better constrained and estimated more precisely. The result is consistent with the literature; a lattice parameter-x value relationship in the literature was used to estimate the x value using this improved estimate and it confirmed an x value of 0.6 has been made. This investigation has thus further validated the previously presented synthesis method and characterised the crystal structure of the material more precisely in preparation for future sintering trials.