| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7963161 | Journal of Nuclear Materials | 2018 | 15 Pages |
Abstract
The interdiffusion was analyzed with an optical microscope, scanning electron microscope, and transmission electron microscope. Uniform and planar interdiffusion layers along the material interface were illustrated with backscatter electron micrographs and energy-dispersive X-ray spectroscopy. Electron diffraction was used to validate phases present in the system, including distinct U2Fe3Si/UFe2 and UFeSi layers at the material interface. While no interaction was observed at 500â¯Â°C, interaction was observed at and above 600â¯Â°C. The amount of interaction between the two materials enhanced progressively at elevated temperatures.
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Authors
Rita E. Hoggan, Lingfeng He, Jason M. Harp,