| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7989872 | International Journal of Refractory Metals and Hard Materials | 2018 | 6 Pages |
Abstract
Earlier, the interface layers have been characterized qualitatively using high resolution transmission electron microscopy (TEM). To get more information about the structure and composition of the interface layers in a Ti containing cemented carbide in this work, Z contrast imaging and spectroscopy using scanning transmission electron microscopy (STEM) have been combined. Elemental maps revealing the structure of the interface layers will be presented.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Arno Meingast, Ernesto Coronel, Andreas Blomqvist, Susanne Norgren, Göran Wahnström, Martina Lattemann,