| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8018418 | Materials Letters | 2015 | 4 Pages |
Abstract
The role of the Ti seed layer thickness on the structural and magnetic properties of Fe19Ni81 thin films was studied. The samples were grown by a sputtering deposition technique on glass substrates at room temperature. The Ti cubic phase transforms into the hexagonal phase with the increase of the Ti layer thickness. Thin Ti seed layer plays very important role in the structure formation of FeNi films with good crystallinity and magnetic softness.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
A.V. Svalov, G.V. Kurlyandskaya, B. González Asensio, J.M. Collantes, A. Larrañaga,