| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8036998 | Thin Solid Films | 2013 | 6 Pages |
Abstract
⺠Zinc oxide (ZnO) films are conductive in the range of 2.0 · 10â 1 Ωcm. ⺠X-ray diffraction, Raman and infrared spectroscopy indicate crystalline ZnO films. ⺠Precursor deposits were proved within the films for low growing temperatures. ⺠Band gap energy changes are achieved due to different growing temperatures.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
I. Zunke, A. Heft, P. Schäfer, F. Haidu, D. Lehmann, B. Grünler, A. Schimanski, D.R.T. Zahn,