Effects of Content and Distribution of Trace Element on Texture and Property of High-Voltage Electronic Aluminum Foil

The content and the distribution of trace elements in aluminum foils for high voltage electrolytic capacitors were investigated by secondary ion mass spectrometer (SIMS) and their effect on the texture and the property of the foils were examined. The results show that the contents of Fe, Si, Cu and Pb are relatively high in the foil. And the contents of trace Fe and Cu have a greater effect on the texture and the electric property of the foils in comparison with those of Si and Pb elements. The average content and the surface enrichment degree of the main trace elements are the main influencing factors for texture composition and the final electric property of the aluminum foils. The variation of near-surface concentration gradient of Fe and Cu along the depth direction is another influencing factor for the electric property of aluminum foils, which will change the resulting mechanism of the trace elements during pit etching, and thus is unfavorable for the stable growth of etched pits.