Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8252360 | Radiation Physics and Chemistry | 2015 | 6 Pages |
Abstract
X-ray fluorescence analysis uses ionizing radiation to study the elemental composition of materials. It is widely used for many purposes, including studies of various cultural and historic relicts and objects of art. This paper summarizes our experience with X-ray fluorescence analysis and attenuated total reflectance Fourier transform infrared spectroscopy in investigating historical photographs by means of portable spectroscopic devices. The results of these measurements provide information about the composition of historical photographs and their toning. They can be used for comparing the processes used in fabricating the photographs, for assessing the quality of the paper and, in many cases, for information about how to repair damaged parts.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
T. Äechák, I. Kopecká, T. Trojek, T. Å tanzel, H. Bártová,