Article ID Journal Published Year Pages File Type
8252778 Radiation Physics and Chemistry 2015 5 Pages PDF
Abstract
This paper deals with several approaches to the application of X-ray fluorescence analysis and micro-analysis to non-destructive investigations of paintings. The methodology is described and demonstrated on a painting of known structure that was painted with modern artistic tempera paints. There is also a description and a demonstration of three depth profiling techniques that provide information on the depth distribution of elements in the surface layers of a painting. The three techniques utilize (a) the internal X-ray ratios of the elements that are present, (b) X-ray fluorescence analysis with two detectors with different angles of detection of characteristic X-rays, and (c) a technique based on comparing X-ray spectra measured with a tilted sample. The capabilities and demands on instrumentation and interpretation of the results are compared for all these techniques.
Related Topics
Physical Sciences and Engineering Physics and Astronomy Radiation
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