Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8252778 | Radiation Physics and Chemistry | 2015 | 5 Pages |
Abstract
This paper deals with several approaches to the application of X-ray fluorescence analysis and micro-analysis to non-destructive investigations of paintings. The methodology is described and demonstrated on a painting of known structure that was painted with modern artistic tempera paints. There is also a description and a demonstration of three depth profiling techniques that provide information on the depth distribution of elements in the surface layers of a painting. The three techniques utilize (a) the internal X-ray ratios of the elements that are present, (b) X-ray fluorescence analysis with two detectors with different angles of detection of characteristic X-rays, and (c) a technique based on comparing X-ray spectra measured with a tilted sample. The capabilities and demands on instrumentation and interpretation of the results are compared for all these techniques.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
T. Trojek, D. Trojková,