High order graph formalism for multilayer structures

Thin-film calculations are an important task during optical design. A new didactic and simple methodology based on flow graph theory is introduced in this article. It is proposed as an alternative way to matrix calculations as well as it is considered to be a new tool to solve lengthy graphical maps. It turned out that, this technique simplifies and reduces the calculus above all, if the impact of certain design parameter upon others is of our interest. However, the method is applied to solve multilayer dielectric structures. Furthermore, as an example to demonstrate the utility of the method, the complex refractive index of the rear surface corresponding to a 3-layer dielectric system is obtained.