Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
852793 | Optik - International Journal for Light and Electron Optics | 2008 | 7 Pages |
Abstract
The possibility to characterize the coherence properties of an electron source is presented. The method, based on the determination of centered-reduced moments of the beam spot, allows the evaluation of both amplitude and phase of the complex degree of spatial coherence. The experimental results are in agreement with a different approach based on the Fourier analysis and with calculations according to the Van Cittert—Zernike theorem.
Related Topics
Physical Sciences and Engineering
Engineering
Engineering (General)
Authors
J. Carrasquilla-Alvarez, R. Castaneda, J. Garcia-Sucerquia, M.A. Schofield, M. Beleggia, Y. Zhu, G. Matteucci,