Article ID Journal Published Year Pages File Type
852793 Optik - International Journal for Light and Electron Optics 2008 7 Pages PDF
Abstract

The possibility to characterize the coherence properties of an electron source is presented. The method, based on the determination of centered-reduced moments of the beam spot, allows the evaluation of both amplitude and phase of the complex degree of spatial coherence. The experimental results are in agreement with a different approach based on the Fourier analysis and with calculations according to the Van Cittert—Zernike theorem.

Related Topics
Physical Sciences and Engineering Engineering Engineering (General)
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