An improved model-based method to test circuit faults

This paper presents an improved model-based reasoning method to test circuit faults. The testing procedure is applicable even when the target system contains multiple faulty modes. Using our method, the observation could be planned appropriately to guarantee correct solutions to be in the restricted candidate space. The existent consistency-checking method and abductive reasoning method are special cases of our method. The relationship between the testing procedure and the corresponding prime implication is analyzed for algorithmic implementation.