| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9676117 | Colloids and Surfaces A: Physicochemical and Engineering Aspects | 2005 | 4 Pages |
Abstract
The effects of the alkyl chain length for AFM anodization nanolithography on different alkylsilane monolayers were demonstrated by fabricating line and dot patterns. The different threshold voltage was observed on different alkylsilane monolayers. The observed threshold voltage gaps between different SAMs may be caused by the electric energy needed to degrade the SAM and the organizations of the SAM with the different alkyl chain length in spite of the similar energy offset. The length of the alkyl chain affects the widths of lines in line patterns, and the diameters of dots in dot patterns, also.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Colloid and Surface Chemistry
Authors
Bumsu Kim, Georgios Pyrgiotakis, Jason Sauers, Wolfgang M. Sigmund,