| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9697389 | Diamond and Related Materials | 2005 | 6 Pages |
Abstract
Effects of the substrate pretreatment and the film properties have been characterized by analytical methods, including SEM, EDX, RAMAN, Profilometer and scratch testing.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
J. Schwarz, K. Meteva, A. Grigat, A. Schubnov, S. Metev, F. Vollertsen,