Article ID Journal Published Year Pages File Type
9697443 Diamond and Related Materials 2005 5 Pages PDF
Abstract
Transient thermal grating and laser flash techniques have been used to measure in-plane (k∣∣) and perpendicular (k⊥) thermal conductivity of 0.3-0.6 mm thick polycrystalline MPCVD diamond films. A small (<20% ) anisotropy in k is revealed, and a correlation of k (8-20 W/cm K at RT) with optical absorption and hydrogen impurity concentration is established. The temperature dependence k(T) between 293 and 460 K follows the relationship k∼T−n (n=0.17-1.02) depending on the diamond quality.
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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