Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9743836 | Analytica Chimica Acta | 2005 | 8 Pages |
Abstract
This paper firstly reports the second-order scattering (SOS) phenomenon in the nucleic acid system using a common spectrofluorometer. And a novel determination method of nucleic acids at nanogram level has been developed. Studies involving calf thymus DNA (ctDNA), fish sperm DNA (fsDNA) and yeast RNA (yRNA) showed that the SOS intensity of nucleic acids can be enhanced by La3+, Ce3+, Nd3+, Sm3+, Eu3+, Gd3+ and Tb3+ ion, of which Eu3+ ion has the largest enhancement. And the intensity of the SOS is proportional to the concentration of nucleic acids. Maximum SOS peak at 550 nm appeared at pH 7.5 and 6.0 Ã 10â5 mol lâ1 CTMAB (cetyltrimethylammonium bromide). Under the optimal conditions, the calibration graphs were linear in the range of 1.0 Ã 10â8 to 4.0 Ã 10â5 g mlâ1 for ctDNA, 6.0 Ã 10â9 to 2.0 Ã 10â6 g mlâ1 for fsDNA, and 8.0 Ã 10â9 to 1.0 Ã 10â6 g mlâ1 for yRNA, respectively. The detection limits were 1.7 ng mlâ1 for ctDNA, 0.36 ng mlâ1 for fsDNA and 0.21 ng mlâ1 for yRNA, respectively. In comparison with most other methods for the determination of nucleic acids, this method is more convenient, more sensitive and simpler. And the possible mechanism was proposed.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Fen Ding, Huichun Zhao, Shilv Chen, Jin Ouyang, Linpei Jin,