| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9778035 | Journal of Non-Crystalline Solids | 2005 | 7 Pages |
Abstract
In this study, the critical parameters relevant to endurance of EEPROM memory cells are theoretically determined from cells geometrical design and programming pulses temporal shape. A new experimental technique is then proposed to realize realistic current pulsed stresses on dedicated large area cell test structures. The influence of the different relevant pulses parameters is finally experimentally studied and discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
N. Baboux, C. Plossu, P. Boivin,