Article ID Journal Published Year Pages File Type
9829431 Journal of Crystal Growth 2005 16 Pages PDF
Abstract
In this paper it is shown that due to the pressure p in the furnace there are three limitations αc_, αc¯, αc¯¯ for the contact angle αc. The lower limit αc_ is in the range (0,π/2-αe), depends on p and on the half-thickness w of the die. The upper limit αc¯ is in the range ( π/2-αe,π/2) and increases when p increases. The limit αc¯¯ is in the range (π/2-αe,αc¯) and depends on p and w. It is shown also, that there exist two limitations w1(p) and w2(p) for w. If w is in the range (0, w1(p)), then the growth angle is achieved for the contact angle in the range (π/2-αe,αc¯¯), and if w∈(w1(p),w2(p)) the growth angle is achieved for the contact angle in the range (π/2-αe,αc¯). The menisci are concave. If w>w2(p), then the growth angle is achieved for the contact angle in the range (αc_,αc¯) and the meniscus is convex-concave. Numerical examples are given for thin silicon sheets of half-thickness 0.5(cm×10-2).
Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
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