Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9829431 | Journal of Crystal Growth | 2005 | 16 Pages |
Abstract
In this paper it is shown that due to the pressure p in the furnace there are three limitations
αc_,
αc¯,
αc¯¯ for the contact angle
αc. The lower limit
αc_ is in the range
(0,Ï/2-αe), depends on p and on the half-thickness w of the die. The upper limit
αc¯ is in the range (
Ï/2-αe,Ï/2) and increases when p increases. The limit
αc¯¯ is in the range
(Ï/2-αe,αc¯) and depends on p and w. It is shown also, that there exist two limitations w1(p) and w2(p) for w. If w is in the range (0, w1(p)), then the growth angle is achieved for the contact angle in the range
(Ï/2-αe,αc¯¯), and if
wâ(w1(p),w2(p)) the growth angle is achieved for the contact angle in the range
(Ï/2-αe,αc¯). The menisci are concave. If
w>w2(p), then the growth angle is achieved for the contact angle in the range
(αc_,αc¯) and the meniscus is convex-concave. Numerical examples are given for thin silicon sheets of half-thickness
0.5(cmÃ10-2).
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
St. Balint, L. Braescu, A.M. Balint, R. Szabo,