Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10364472 | Microelectronics Journal | 2005 | 4 Pages |
Abstract
In this paper we report the use of photothermal techniques such as Thermal lens (TL) spectrometry, Photoacoustic and heat capacity, Ïcp, to determine the thermo-optical parameters, such as thermal conductivity (K), thermal diffusivity (D), specific heat (cp) and the optical path dependence with temperature (ds/dT), of an undoped polycrystalline 3C-SiC. To our knowledge, this is the first time that Thermal lens technique is used for wide band-gap systems. Results obtained for the polycrystalline sample with TL technique indicates that ds/dT is negative at room temperature. Moreover, the obtained values of thermal diffusivity and thermal conductivity are in good agreement with that found in the literature, indicating that the phototermal techniques can be used to obtain the referred parameters in circumstances where other techniques cannot be used, for example, in harsh environments.
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Authors
V. Anjos, M.J.V. Bell, E.A. de Vasconcelos, E.F. Jr., A.A. Andrade, R.W.A. Franco, M.P.P. Castro, I.A. Esquef, R.T. Jr.,