| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10364505 | Microelectronics Journal | 2005 | 5 Pages |
Abstract
A Michelson interferometer was used as a precise detector in the Mirage effect configuration in order to determine the thermal diffusivity of the diluted magnetic semiconductor Cd1âxMnxTe, in the concentration range 0
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
E. Corona-Organiche, E. López-Cruz, C. Vázquez-López, Juan E. Morales,