| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10364712 | Microelectronics Reliability | 2015 | 12 Pages |
Abstract
Experimental results demonstrate the flexibility of this test bench with respect to various power cycling conditions, as well as the feasibility of the proposed on-line monitoring methods.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Francois Forest, Amgad Rashed, Jean-Jacques Huselstein, Thierry Martiré, Philippe Enrici,