| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10364715 | Microelectronics Reliability | 2015 | 7 Pages |
Abstract
Process and temperature invariant voltage multiplier performance has been examined. The analytical predictions of ripple voltage and frequency response are in good agreement with ADS simulation results. In addition, a threshold voltage compensation scheme is investigated to improve the output voltage sensitivity against process variations and temperature fluctuation. The threshold voltage compensation technique effectively reduces the temperature and process variability on the voltage multiplier performance.
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Authors
J.S. Yuan, Y. Bi,