| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10364719 | Microelectronics Reliability | 2015 | 5 Pages |
Abstract
The temperature distribution on a ceramic substrate with a small heating element in the middle has been measured by infrared thermography. By comparing the experimental data with a theoretical analysis, the thermal conductivity could be easily obtained.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
G. De Mey, M. Felczak, B. WiÄcek,