| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10364965 | Microelectronics Reliability | 2005 | 6 Pages |
Abstract
This paper describes a statistical approach to simulating the reliability of systems with HBT devices. Compared to the conventional worst-case method, the described approach utilizes statistical reliability information of the HBT individual devices, along with analysis on the critical paths of the system, to provide more accurate and more comprehensive reliability evaluation of the systems utilizing HBT devices.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Yuan Chen, Qing Wang, Sammy Kayali,