| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10364971 | Microelectronics Reliability | 2005 | 6 Pages |
Abstract
This paper presents possibilities of analysis of thermal properties of layered structures basing on the results of photoacoustic investigations in pulse excitations mode. The influence of linear distortions on results of measurements is discussed and the method of its elimination is proposed. This method uses the concept of thermal contrasts for harmonic excitations.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Zbigniew Suszynski, RadosÅaw Duer,