Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10365159 | Microelectronics Journal | 2005 | 9 Pages |
Abstract
A test methodology for switched capacitor circuits is described. The test approach uses a built-in sensor to analyze the charge transfer inside the circuit under test (CUT). The test methodology is applied to a 10-bit algorithmic analog to digital converter to obtain the static linearity and to the simulated fault coverage figures taking into account a catastrophic fault model. The goodness of the charge sensor has been experimentally evaluated with an SC integrator for fault detection and built-in sensor influence on the CUT performance.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
R. Mozuelos, Y. Lechuga, M. MartÃnez, S. Bracho,