Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10365161 | Microelectronics Journal | 2005 | 11 Pages |
Abstract
This paper presents a digital approach to frequency testing of Analogue and mixed-signal (AMS) circuits. This approach is aimed at facilitating low-cost test techniques for system-on-chip (SoC) devices, rendering the test of mixed-signal cores compatible with the use of a low-cost digital tester. Analogue test signal generation is performed on-chip by low pass filtering a sigma-delta (ΣÎ) encoded bit-stream. Analogue harmonic test response analysis is also performed on-chip using square wave modulation and ΣΠmodulation. Since both analogue signal generation and test response analysis are digitally programmable on-chip, compatibility with a low-cost digital tester is ensured. Optimisation of test signatures is discussed in detail as a trade-off between fault and yield coverage. A 0.18 μm CMOS implementation of this BIST technique is presented, including some experimental results.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Guillaume Prenat, Salvador Mir, Diego Vázquez, LuÃs RolÃndez,