| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10365322 | Microelectronics Reliability | 2005 | 12 Pages |
Abstract
A new, area efficient, boosted and distributed active MOSFET rail clamp network for I/O pad ESD protection is presented. In addition, a compact new rail clamp trigger circuit with high resistance to false triggering is introduced.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Michael Stockinger, James W. Miller, Michael G. Khazhinsky, Cynthia A. Torres, James C. Weldon, Bryan D. Preble, Martin J. Bayer, Matthew Akers, Vishnu G. Kamat,