Article ID Journal Published Year Pages File Type
10365328 Microelectronics Reliability 2005 7 Pages PDF
Abstract
This paper describes a new test method called capacitively coupled transmission line pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests. The cc-TLP results correlate well with the CDM data.
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Physical Sciences and Engineering Computer Science Hardware and Architecture
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