Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10365328 | Microelectronics Reliability | 2005 | 7 Pages |
Abstract
This paper describes a new test method called capacitively coupled transmission line pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests. The cc-TLP results correlate well with the CDM data.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Heinrich Wolf, Horst Gieser, Wolfgang Stadler, Wolfgang Wilkening,