| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10365670 | Microelectronics Reliability | 2014 | 6 Pages |
Abstract
The authors present a methodology for extrapolating the safe operating area for HBTs, accounting for variations in emitter area and ballast resistor size. Measurements of SOA curves for HBTs with varying emitter areas and ballast resistor sizes were made, and a simple mathematical extrapolation developed for other SOA curves. This extrapolation was successfully demonstrated as predicting a further SOA curve.
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Robert S. Howell, Randall Lewis, H. George Henry, Harold Hearne, Deas Brown, Dale Dawson, Andris Ezis,