Markov process based reliability model for laser diodes in space radiation environment

The reliability of laser diodes is a prerequisite for use in satellite optical communication systems, which is significant influenced by both displacement damage effect and annealing effect. A reliability model was proposed to evaluate the reliability and lifetime for laser diodes in space radiation environment. Degradation process is separated into discrete states, and reliability model is subsequently established based on Markov process. The Markov process consists of a Poisson process and an exponential process, representing the displacement damage effect and annealing effect, respectively. Reliability characteristics of a given laser diode are simulated over 100,000 h, and applicability of this reliability model is demonstrated by analyzing the variety trend of probability density of performance states.