| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10365696 | Microelectronics Reliability | 2014 | 6 Pages |
Abstract
The mathematical models of thermally-induced degradation processes in solids with nano- and microscale topological disordering - bulk and thick-film ceramic composites based on mixed transition-metal manganites are considered. It was shown that degradation transformations in these materials are best described by stretched or suppressed exponential relaxation function. The stretched exponential degradation kinetics is proper to own degradation transformations in such one-type systems as bulk ceramics and multilayered thick-film structures. The mechanism of degradation transformations in one-layered thick films, including two or more different on their origin elementary are described by suppressed exponential kinetics.
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Authors
H. Klym, V. Balitska, O. Shpotyuk, I. Hadzaman,