| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10365697 | Microelectronics Reliability | 2014 | 4 Pages |
Abstract
The reactivity of phosphor with water was investigated by measuring pH change, and the results are compared with long-term reliability test results as well as scanning electron microscope (SEM) and inductively coupled plasma optical emission spectroscopy (ICP-OES) results. We found that the slope of pH change strongly depends on phosphor composition and represents a long-term reliability test result induced by phosphor in an LED package.
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Authors
Minho Choi, Ki Hyun Kim, Changhun Yun, Dai Hyoung Koo, Sang Bin Song, Jae Pil Kim,