Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
11012399 | Microelectronics Reliability | 2018 | 5 Pages |
Abstract
A qualitative favorable comparison between experimental data and simulated results is also obtained.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
T.H. Nouibat, Z. Messai, D. Chikouch, Z. Ouennoughi, N. Rouag, M. Rommel, L. Frey,