Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
11016421 | Microelectronics Reliability | 2018 | 7 Pages |
Abstract
In this paper, we apply the Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of electronic systems, to derive PoF models for supercapacitors at different stresses relevant for some industrial applications. It is expected from these models to better understand the performance of supercapacitors at different stresses and to predict accurate lifetime of supercapacitors allowing industry to robustly design their products and avoid high field returns.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
A.B. Temsamani, S. Kauffmann, S. Helsen, T. Gaens, V. Driesen,